X-ray inspection of tires and rubber
Tires, composite rubber and rubber-compound parts such as reinforced tubes can be easily tested for defects by means of X-ray systems. Flaws in the reinforcement, foreign objects and air inclusions are detected reliably using systems from YXLON.
YXLON offers various systems for analyzing tires and rubber parts. Optimally customized solutions are available, depending on the application and defect pattern involved.
Y.MTIS is the X-ray system of choice for the series inspection of passenger-car and truck tires. The inspection system is integrated directly into the production line. The main flaws captured are anomalies in steel wires (e.g. position, spacing, damage) along with foreign objects and air inclusions. In conjunction with the automatic software
Y.TireAXIS™, the
Y.MTIS inspection system is able to complete its tasks operator-free.
With the tire inspection system
Y.CT Tire, the tire or tire & wheel unit is captured three-dimensionally via computed tomography. Geometric measurement of the components in 3D is easily accomplished like this. The
Y.CT Tire inspection system is frequently utilized in R&D departments.
The X-ray system
Y.MiniOTR has been developed for large and heavy off-the-road tires. In the case of these large tires, normally 100% of production is tested for anomalies. This system profits from the considerable amount of experience YXLON accumulated with
Y.MTIS.
When it comes to X-raying individual wheel & tire units, the X-ray system
Y.MU2000-D Tire-On-Wheel is a highly viable product. For example, the location of the tire bead on the wheel is visualized in a tangential scan.
Above and beyond these, YXLON has developed systems specific to the customer that inspect rubber granulate on conveyor belts for the presence of foreign objects.
We offer you a wide range of X-ray techniques at our
application centers. We design solutions that replace X-ray films, provide radioscopy and fully automatic defect recognition in X-ray images, as well as
computed tomography services for scanning inspection items ranging from micro-CT to CT using a linear accelerator.