Computed tomography (CT) offers a three-dimensional view into the inspection item. This enables precise pore and wall-thickness analysis, the determination of geometric tolerances, comparisons of actual vs. target situations or the extraction of STL data.
CT makes a more accurate analysis of the inspection item possible than radiography can do due to the depiction of the inspection item in 3D. In addition to an inspection appraisal offering greater precision, computed tomography supplies valuable information for the production process itself. This kind of information helps to speed up processes, for instance during initial prototyping, or to reduce the number of rejects by using CT data to enable the process to be corrected on a timely basis.
There are a great many areas for using computed tomography, ranging from highly specialized tasks in CT inline inspection to universal X-ray systems, metrology and high-resolution CT, for example in microelectronics.
A broad-based portfolio and an in-depth understanding of technology are required to optimize CT systems for these very different tasks. That's why, YXLON designs and develops key components, for instance microfocus X-ray tubes, line detectors or software, either by itself or in close cooperation with partners.
This technology is available in YXLON X-ray systems and computed tomography systems.
At our application centers we offer you computed tomography services for scanning inspection items ranging from µCT to CT using a linear accelerator.