The Y.MU 2000 is an industrial X-ray inspection system equally well suited for spot sample and serial inspection.
To ensure uniform product quality, it is mandatory to rapidly and consistently acquire information about the inner structure of products and materials and to define distinct quality attributes. YXLON International, the leading provider of industrial X-ray inspection systems for non-destructive material testing, offers the Y.MU 2000 as a market proven solution to assist you with your inspection task. The X-ray inspection system Y.MU 2000 is equally suited for spot sample and 100% inspection. It offers high X-ray inspection quality for materials as diverse as steel, aluminum, ceramic, composite materials or rubber. The X-ray inspection system Y.MU 2000 is based on the concept of de-coupled manipulation: X-ray source and detector move independently from the part manipulator. This concept was originally developed for the world NDT market by YXLON International and sold many times since. It maximizes the inspection envelope in a given X-ray shielded area and minimizes the necessary footprint. Excellent image quality allows the operator to quickly and efficiently identify fine details and contrasts during spot sample or serial inspection. High throughput of the X-ray inspection system is the result. The ergonomic design and simple, intuitive operation of the entire X-ray inspection system also contributes to a reduced inspection time.
For more information on the universal X-ray inspection system MU2000, please do not hesitate to contact us.
