Inclined CT, the best inspection solution for 3-terminal power semiconductor devices

An insulated-gate bipolar transistor (IGBT) is a three-terminal power semiconductor device primarily used as an electronic switch developed to combine high efficiency and fast switching.
Read more

Helical Scanning with Cutting Edge CT X-ray Systems

In an exclusive webinar, Peter Kramm, YXLON Senior Product Manager, discusses the revolutionary computed tomography technology found in the YXLON FF20 CT and FF35 CT systems, with a detailed segment on helical scans.
Read more

How Computed Tomography Reveals the Internal Anatomy of Bat Skulls

Abigail Curtis, a postdoctoral fellow at the American Museum of Natural History in New York, demonstrates how computed tomography reveals unexpected scientific insights into bat physiology. X-ray with computed tomography is used to create digital reconstructions of modern and fossilized bat samples.
Read more

Computed Tomography for Non-Destructive Testing in Natural History Museum Collections

In a recent CT Science Days event, Dr. Edward Stanley, PhD of herpetology, of the California Academy of Sciences, discussed how researchers are using computed tomography to study reptiles and amphibians in ways that preserve specimens and facilitate collaboration.
Read more

How It's Made: A Video Introduction to Computed Tomography

Computed tomography (CT) goes light years beyond regular 2-D X-ray technology to deliver accurate three-dimensional images of scanned objects, including their voids and areas of differing density. Jason Robbins, YXLON Senior Product Manager, explains the science of CT in this (fun and nerdy!) educational video.
Read more

Industrial Computed Tomography for Composites: Webinar Nov. 8th

You are invited to attend a free CompositesWorld.com webinar to learn how computed tomography (CT) can be used for the inspection of fiber orientation.
Read more

Advances in X-Ray Inspection For Electronics, Part 3: Microelectronics

As new technologies emerge, they push x-ray systems to evolve and adopt new methods of imaging in difficult materials and locations. One of today's more prevalent and demanding areas that x-ray systems has been able to provide a solution is in microelectronics. 
Read more

Going Beyond Pass/Fail with Automatic Defect Recognition (ADR)

X-ray inspection has long been a preferred way to obtain non-destructive quality data on manufactured parts. With the advent of digital X-ray systems, improved imaging capabilities, and more powerful computers, many manufacturers have come to rely on non-destructive X-ray test systems to make pass/fail decisions on individual parts. This is called Automatic Defect Recognition or ADR.

 
Read more

Advances in X-ray Inspection for Electronics, Part 2: Which Tube?

Within the realm of X-ray inspection for electronics there are a wide range of applications, so a single type of X-ray tube is not a "one-size-fits-all" solution. To address the demands of industries such as electronics manufacturing, better X-ray system manufacturers offer various non-destructive test solutions based on the power, kV and feature recognition capabilities electronics producers need.
Read more

Advances in X-ray Inspection for Electronics, Part 1: Tubes

The “open” transmission X-ray tube was a major step forward for x-ray inspection. This technology itself is  almost 55 years old, but was adopted for X-ray inspection for electronics in 1982 when the German company Feinfocus introduced the first open Microfocus tube. Most  modern high technology electronics systems use Open Tubes.

Read more

X-ray Tube Energies: How High Is Too High?

Enjoy this excerpt from our latest paper, How to Select the Newest X-ray Technology: From Nano to Macro.

Read more

Does X-ray ADR lead to Higher Efficiency and Reliability in Inspection?

When computers take over for humans in most futuristic science fiction movies, the outcomes are usually bad for people. However, when it comes to automated defect recognition (ADR) in real world non-destructive testing, it can be a life saver.

Read more