Void Inspection of Complex Assemblies using Computed Laminography

Electronics manufacturing companies face the challenge of precise porosity evaluation inside their products. Peter Koch and Jeff Urbanski show new analysis methods working together for more accurate void measurement at critical interfaces.
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CT Metrology simply just in between – the Test

High-resolution CT of a 3D-printed plastic impeller by the YXLON FF35 CT Metrology system provides clear insights into the inner structures and accurate results. What about the capabilities of YXLON UX20 with the new MesoFocus tube?
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Talking about Flat-Panel Detector's Resolution

When we look for the optimal flat-panel detector, it’s not all about the highest possible resolution. Christian Jeuschede explains why we still stick to 139 µm respectively 150 µm pixel pitch instead of 100 µm and what to have in mind when chosing the best fit for your applications.
 
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Exploring Accuracy and Uncertainty in Computed Tomography

There is a range of terminology for CT system accuracy and uncertainty that should be understood when evaluating 3D scanning systems, this blog post illustrates some of those terms, such as Precision and Accuracy, Tolerance, Uncertainty of Measurement, Resolution, Error, and Suitability.
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Big Data in Industry 4.0 with At-line X-ray Inspection

Industry 4.0, Internet of Things, Big Data, and Smart Factories are not only trendy buzzwords, the concept of machine to machine communication and integration is becoming vital to the advancement of many manufacturing industries.
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