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Void Inspection of Complex Assemblies using Computed Laminography
Electronics manufacturing companies face the challenge of precise porosity evaluation inside their products. Peter Koch and Jeff Urbanski show new analysis methods working together for more accurate void measurement at critical interfaces.
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Service Matters
Kathy Scott, Service Sales Director at Yxlon/Comet Technologies USA knows that service matters. With her 29 years of experience, she knows service and support should rate nearly as high in the decision to purchase a non-destructive testing (NDT) inspection system as the system itself.
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Inclined CT, the best inspection solution for 3-terminal power semiconductor devices
An insulated-gate bipolar transistor (IGBT) is a three-terminal power semiconductor device primarily used as an electronic switch developed to combine high efficiency and fast switching.
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